2026
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This preprint evaluates data-matrix-based goodness-of-fit tests for confirmatory factor analysis within structured factor analysis. The proposed IPEO test assesses a single model, and the ΔIPEO test compares nested models. IPEO measures the share of observed-data variation that a model fails to reproduce; a bootstrap p value evaluates statistical evidence of misfit. Simulations examined Type I error and power and found that the proposed tests remained usable in conditions where conventional chi-square procedures often failed. An empirical example illustrates how the fit index and its p value convey complementary information about the size and statistical significance of misfit. The authors present these procedures as complements to covariance-based CFA fit assessment.
PsyArXiv preprint v1 (10.31234/osf.io/wav2b_v1) · Original abstract
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PsyArXiv public preprint, version 1
Posted 2026-10-06
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Young Ze Kim, Gyeongcheol Cho, Hanjoe Kim (2026). Data-Matrix-Based Overall Goodness-of-Fit Testing for Confirmatory Factor Analysis: In-Sample Prediction Error for Observed Variables. Preprint. https://doi.org/10.31234/osf.io/wav2b_v1